Vol 15 Issue 7 2025
- Enhanced Circuit Board Defect Detection Using YOLO-Base Deep Learning
Harun Abdulrashid Panari, Sanjay Babasaheb Patil
D.Y. PATIL College of Engineering & Technology Kolhapur.
PAGE NO: 1-17
doi.org/10.5281/zenodo.16403395
Scopus And Ugc Care Group 2 Journal (ISSN:0258-7982)